An exploratory study of the effects of the dielectric-barrier-discharge surface pre-treatment on the self-assembly processes of a (3-Aminopropyl) trimethoxysilane on glass substrates

NY Cui, C Liu, NMD Brown, BJ Meenan

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18 Citations (Scopus)

Abstract

X-ray photoelectron spectrometry (XPS), Fourier transform infrared spectrometry (FTIR), secondary-ion-mass spectrometry (SIMS) and contact angle measurement have been used in study of the enhancement effect of substrate pre-treatment by dielectric-barrier-discharge (DBD) for the self-assembly of a (3-Aminopropyl) trimethoxysilane (APTS) on glass substrates. In results, the concentration of the APTS molecules self-assembled on the surfaces of both the acetone-washed and the DBD-treated substrates were more than three times of that on the as-supplied substrate. Meanwhile, the self-assembly (SA) layers grown on the DBD-treated substrates have the best quality compared to those grown on the substrates pre-treated in other ways in terms of the silane-substrate bonding and the order of arrangement of the silane molecules.
Original languageEnglish
Pages (from-to)6932-6938
JournalApplied Surface Science
Volume253
Issue number16
DOIs
Publication statusPublished - Feb 2007

Bibliographical note

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Keywords

  • Dielectric-barrier-discharge
  • Self-assembly
  • Silane

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