We present a comparative study where carbon nanostructures were prepared by electron and ion beam methods. The deposited thin films were analysed by Raman analysis, nanoindentation, Energy dispersive X-ray analysis (EDX) and atomic force microscopy (AFM). In most conditions, the material formed is hydrogenated amorphous carbon. This study was used to form sharp AFM supertip structures which were successfully used to image sintered ceramic samples.
|Number of pages||4|
|Publication status||Published - 2006|
|Event||2006 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2006 Technical Proceedings - Boston, MA, United States|
Duration: 7 May 2006 → 11 May 2006
|Conference||2006 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2006 Technical Proceedings|
|Period||7/05/06 → 11/05/06|
Copyright 2008 Elsevier B.V., All rights reserved.
- Electron beam induced deposition
- Focused ion beam
- Hydrogenated amorphous carbon
- Raman spectroscopy