Fault Diagnosis of Electronic Systems Using Intelligent Techniques: A Review

Research output: Contribution to journalArticlepeer-review

140 Citations (Scopus)
Original languageEnglish
Pages (from-to)269-281
JournalIEEE Transactions on Systems, Man, and Cybernetics, Part C: Applications and Reviews
Volume31
Issue number3
DOIs
Publication statusPublished - 1 Aug 2001

Bibliographical note

Other Details
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This paper represents the culmination of collaborative research with International Test Technologies Ltd, who specialise in functional test and diagnostic solutions for processor boards. Professor John Sheppard (John Hopkins University), who reviewed the paper, indicated: “The primary contribution is that it provides a complete review of all major AI-based approaches to diagnostics. As mentioned previously, there are several papers and books that review diagnostics within the context of a particular technique; however, I have seen nothing that attempts to discuss the pros and cons across all major techniques. As such, this paper has the potential to fill an important void.”

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