Selecting critical patterns based on local geometrical and statistical information

Mathematics

• Classifier 52%
• Spatial Information 25%
• Class 23%
• Multilayer Perceptron 23%
• Support Vector Machine 19%
• Radial Basis Function 18%
• Training 16%
• Nearest Neighbor 16%
• Experimental Results 15%
• Benchmark 15%
• Tangent line 14%
• Hyperplane 14%
• Sufficient 11%
• Demonstrate 9%

Engineering & Materials Science

• Classifiers 100%
• Multilayer neural networks 48%
• Support vector machines 37%